Atomic force microscope LAFM-A11 Catalog

Overview

Atomic force microscope LAFM-A11 comes with combined design of scan head and sample stage, to give strong anti-vibration performance. Adopted with servomotor, drives the sample approaching tip manually or automatically, to evaluate precise scanning area position. Equipped with precision laser detection and probe alignment device, make easy adjustment of laser beam.

Features :

Large sample transfer range
Optical observation system for checking tip & sample’s position
Modular electronic system for easy maintenance
CCD observing system
Equipped with servomotor to achieve CCD auto focusing
Provides highly accurate results

Specifications :

Operation modes	Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scan angle 0 to 360°
Scan angle	0 to 360°
Maximum scan range	X/Y axis: 50 µm, Z axis: 5 µm
Optical system/ Magnification of CCD	Magnification: 10x, Resolution: 1 µm
Resolution	X/Y axis: 0.2 nm, Z axis: 0.05 nm
Sample size	Ø≤ 90 mm, H≤ 20 mm
Sample movement	0 to 20 mm
Pulse width of approaching motor	10 ± 2 ms
Scan rate	0.6 Hz to 4.34 Hz
Scanning control	XY: 18 bit D/A & double 16 bit A/D multiple channel simultaneously
Types of sampling pixel	256×256, 512×512
Feedback type	DSP digital feedback
Feedback sampling rate	64 KHz
PC connections:	USB 2.0
Windows software	Compatible with windows 98/2000/XP/7/8
Instrument Diemnsion	700 × 500 × 460 mm
Net weight	50 kg
Gross Weight	87.4 kg

Applications :

It finds best solution for applications in biochemistry for tissues, cells, cellular components imaging, nanotechnology for imaging of polymers, nanomaterials, and in chemistry physics for imaging of surface metals elements.