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XRD Diffractometer LXRD-A10

XRD Diffractometer LXRD-A10

XRD Diffractometer LXRD-A10 contains tube current up to 5 to 80 mA with a dimension 1 × 10 mm/ 0.4 × 14 mm/ 2 × 12 mm and are designed for quality diffraction data, combined with ease of use and flexibility to quickly switch to different applications, This multipurpose diffractometers are all equipped with X-ray tuble of glass tube, ceramic tube, ripple ceramic tube with many different X-ray source materials (Cu, Fe, Co, Cr and Mo) and is coupled with an auto-switching dual wavelength optic. It have Low maintenance, high performance system and designed with Horizontal Goniometer structure and proportional/Scintillation counters detector.

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X-ray Tuble Glass tube, Ceramic tube, Ripple Ceramic tube: Cu, Fe, Co, Cr, Mo etc., Power 2 kW
Focus Size 1 × 10 mm/ 0.4 × 14 mm/ 2 × 12 mm
Stability ≤ 0.01 %
Tube Current 5 to 80 mA
Tube Voltage 10 to 60 kV
Rated Power 3 kW
Goniometer Structure Horizontal (Ø to 2 Ø )
Radius of Diffraction 185 mm
Scanning Range 0 to 164
Scanning Speed 0.0012º to 70 º min
Maximum Resolving Speed 100 º / min
Scanning Mode Ø to 2 Ø linkage, Ø, 2 Ø single action; continuous/stepping scanning
Angle Repeatable Accuracy 1 / 1000 º
Minimal Stepping Angle 1 / 1000 º
Detector Proportional/Scintillation counters
Maximum Counting rate of Linearity 5 × 105 CPS (with the compensate function of dropout counting)
Energy Resolution Ratio ≤ 25 % (PC), ≤ 50 % (SC)
Counting Fashion Differential Coefficient / integral, PHA automatically, Dead time regulate
Stability of System measure ≤ 0.01 %
Scattered Rays Dose ≤ 1 µ Sv/h (without X-ray protective device)
Instrument Integrative Stability ≤ 0.5 %
Dimension 1100 × 850 × 1750 mm
Weight About 25 kg
  • Diffractometer is equipped with X-ray tuble of glass tube, ceramic tube, and ripple ceramic tube with many different X-ray source materials (Cu, Fe, Co, Cr and Mo)
    Coupled with an auto-switching dual wavelength optic
    Horizontal Goniometer structure
    Proportional/Scintillation counters detector
    For testing unknown samples it has phase identification and phase analysis for known mixed samples
    Crystal structure varies with temperature (high temperature vice versa) factor and chemical information tested by X-ray diffraction test device
    Equipped with programmable operation, integrated structure design with easy operation and well-designed outlook
    High throughput with high accuracy diffraction angle measurement
    Scanning range and Scanning speed are well design in equipment

Best suited for the research and industrial product analysis with perfect combination of conventional analysis crucial measurement product and for academics and researchers in different application areas.

{"X-ray Tuble":"Glass tube, Ceramic tube, Ripple Ceramic tube: Cu, Fe, Co, Cr, Mo etc., Power 2 kW","Focus Size":"1 \u00d7 10 mm\/ 0.4 \u00d7 14 mm\/ 2 \u00d7 12 mm","Stability":"\u2264 0.01 %","Tube Current":"5 to 80 mA","Tube Voltage":"10 to 60 kV","Rated Power":"3 kW","Goniometer Structure":"Horizontal (\u00d8 to 2 \u00d8 )","Radius of Diffraction":"185 mm","Scanning Range":"0 to 164","Scanning Speed":"0.0012\u00ba to 70 \u00ba min","Maximum Resolving Speed":"100 \u00ba \/ min","Scanning Mode":"\u00d8 to 2 \u00d8 linkage, \u00d8, 2 \u00d8 single action; continuous\/stepping scanning","Angle Repeatable Accuracy":"1 \/ 1000 \u00ba","Minimal Stepping Angle":"1 \/ 1000 \u00ba","Detector":"Proportional\/Scintillation counters","Maximum Counting rate of Linearity":"5 \u00d7 105 <\/sup> CPS (with the compensate function of dropout counting)","Energy Resolution Ratio":"\u2264 25 % (PC), \u2264 50 % (SC)","Counting Fashion":"Differential Coefficient \/ integral, PHA automatically, Dead time regulate","Stability of System measure":"\u2264 0.01 %","Scattered Rays Dose":"\u2264 1 \u00b5 Sv\/h (without X-ray protective device)","Instrument Integrative Stability":"\u2264 0.5 %","Dimension":"1100 \u00d7 850 \u00d7 1750 mm","Weight":"About 25 kg"}
Diffractometer is equipped with X-ray tuble of glass tube, ceramic tube, and ripple ceramic tube with many different X-ray source materials (Cu, Fe, Co, Cr and Mo)
Coupled with an auto-switching dual wavelength optic
Horizontal Goniometer structure
Proportional/Scintillation counters detector
For testing unknown samples it has phase identification and phase analysis for known mixed samples
Crystal structure varies with temperature (high temperature vice versa) factor and chemical information tested by X-ray diffraction test device
Equipped with programmable operation, integrated structure design with easy operation and well-designed outlook
High throughput with high accuracy diffraction angle measurement
Scanning range and Scanning speed are well design in equipment
Best suited for the research and industrial product analysis with perfect combination of conventional analysis crucial measurement product and for academics and researchers in different application areas.


FTIR Spectrometer

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FTIR Spectrometer LIR-B10
Spectral Range 7800 cm-1 to 350 cm-1
Resolution 0.85 cm-1
Wave number precision ± 0.01 cm-1

Atomic Fluorescence Spectrometer

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Atomic Fluorescence Spectrometer LAFS-A10
Beam Configuration Dual Channel
Elements ( Measuring Range )
As, Se, Pb, Bi, Sb, Te, Sn < 0.01 µg/L
Hg, Cd < 0.001 µg/L
Zn < 1.0 µg/L
Ge < 0.1 µg/L
Precision ( RSD ) < 1.0

Angular Spectrometer

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Angular Spectrometer LASM-A10
Angle Measurement Accuracy 1inch
Optical Parameter
Focal Length 170 mm
Effective Aperture Φ 22 mm
Field of View 3° 22inch
Focal Length of Telescope’s Eyepiece 24.3 mm
Maximum Length Between Collimator and Telescope 120 mm
Slit Width 0.02 to 2 mm
Diopter Compensation Range ≥ ± 5 diopters
Divided Circle
Diameter Φ178 mm
Circle Graduation 0° to 360°
Division 0.5°
Vernier Reading Value 1inch

ICP Spectrometer

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ICP spectrometer LICP-A10
Wavelength range ( 3600 lines / mm ) 180 to 500 nm
Wavelength range ( 2400 lines / mm ) 180 to 800 nm
Temperature 20 ~ 28 °C
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ICP Spectrometer LICP-B10
Monochromator Specifications
Optical type Czerny turner
Resolution ≤ 0.015nm (3600 line grating)
≤ 0.030nm (2400 line grating)
Focal length 1000 mm
Grating specifications huge holographic grating with 3600 L/mil or 2400 L/mil and 80 mm × 100 mm of ruling area
Wavelength range 195 to 500 nm for 3600 line grating
195 to 800 nm for 2400 line grating
Solid State Power Specifications
Frequency 27.12 MHz
Frequency stability: < 0.05%
Spray chamber Scott double pass spray chamber
Output power 800 W to 1600 W, adjustable with power efficiency more than 65%
Output power stability ≤ 0.05%
Induction coil 25 mm × 3 ID (ID-internal diameter), equipped with three concentric quartz torch tubes 35 mm ED (ED-external diameter)
Technical Specifications
Suitable sample content range Liquid sample: 0.01 ppm to several thousand ppm
Solid or power sample: 0.001% to 70%
Repeatability short-term stability- RSD ≤ 1.5%
Long-term stability: RSD ≤ 2%
Test speed 5 to 8 elements / min
Limits of detection (LOD, µg/L) for most elements 1ppb to 10ppb

XRF Spectrometer

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XRF-Spectrometer LXRF-A10
Measureable elements S to U
Detection limit 1 ppm
Temperature 15 ~ 30 °C
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Handheld XRF Spectrometer LXRF-B10
Analytical Method Energy dispersive X-ray fluorescence analytical Method
Elements Measuring Atomic number from 12 to 92 [elements from magnesium (Mg) to uranium (U)] can be measured
Range Simultaneous detector

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