XRF-Spectrometer LXRF-A10 is a microprocessor controlled high-count throughput unit with low detection limits for wide range of elements. Provision of multi-elemental analysis with detection limits upto 1 ppm. Built-in movable platform for easy location of testing point.High resolution detector improves analysis accuracy. Equipped with safety features of optical tube shielding with no X-ray radiation and high voltage emergency locking.
Buy Now View CatalogMeasureable elements | S to U |
Detection limit | 1 ppm |
Temperature | 15 ~ 30 °C |
Elemental content | 1 ppm to 99 % |
Repeatability | 0.001 |
Stability | 0.001 |
Power supply | AC 220 V ± 5 V |
Dimensions | 550 x 410 x 320 mm |
Weight | 45 kg |
Used in detection of plating thickness of metals, concentration of plating solution , RoHS detection and analysis, full-element analysis and electro plating industries
Analytical Method : Energy dispersive X-ray fluorescence analytical Method
Elements Measuring : Atomic number from 12 to 92 [elements from magnesium (Mg) to uranium (U)] can be measured
Range : Simultaneous detector
Analytical Method : Energy dispersive X-ray fluorescence analytical Method
Elements Measuring : Atomic number from 12 to 92 [elements from magnesium (Mg) to uranium (U)] can be measured
Range : Simultaneous detector
Beam Configuration | Dual Channel | ||||||||
Elements ( Measuring Range ) |
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Precision ( RSD ) | < 1.0 |
X-ray Tuble | Glass tube, Ceramic tube, Ripple Ceramic tube: Cu, Fe, Co, Cr, Mo etc., Power 2 kW |
Focus Size | 1 × 10 mm/ 0.4 × 14 mm/ 2 × 12 mm |
Stability | ≤ 0.01 % |
Wavelength range ( 3600 lines / mm ) | 180 to 500 nm |
Wavelength range ( 2400 lines / mm ) | 180 to 800 nm |
Temperature | 20 ~ 28 °C |
Monochromator Specifications |
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Solid State Power Specifications |
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Technical Specifications |
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Spectral Range | 7800 cm-1 to 350 cm-1 |
Resolution | 0.85 cm-1 |
Wave number precision | ± 0.01 cm-1 |
Angle Measurement Accuracy | 1inch | ||||||||||||||
Optical Parameter |
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Divided Circle |
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